ECN publicatie:
Titel:
Error diagnosis and optimisation of cSi solar cell processing using contact resistances determined with the CoreScanner
 
Auteur(s):
Heide, A.S.H. van der; Bultman, J.H.; Hoornstra, J.; Schönecker, A.
 
Gepubliceerd door: Publicatie datum:
ECN Zonne-energie 1-6-2001
 
ECN publicatienummer: Publicatie type:
ECN-RX--01-035 Conferentiebijdrage
 
Aantal pagina's: Volledige tekst:
2 Download PDF  (136kB)

Gepresenteerd op: 12th Photovoltaic Science and Engineering Conference, Jeju, Korea, 11-15 juni 2001.

Samenvatting:
The screen printing metallisation process used for 90% of the solar cells in industry is very sensitive to the process conditions. Contrary to the general opinion that the contact resistance between front side metallisation and silicon is good or bad across the entire surface, large inhomogeneities in contact resistance are often present.In this paper the so-called Corescanner, which will soon be commercially available, is used to investigate the relation between some processing parameters and the contact resistance distribution on a solar cell.


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