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Titel:
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Mapping of contact resistance and locating shunts on solar cells using resistance anaysis by mapping of potential (RAMP) techniques
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Auteur(s):
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Gepubliceerd door:
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Publicatie datum:
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ECN
Zonne-energie
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1-5-2000
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ECN publicatienummer:
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Publicatie type:
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ECN-RX--00-014
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Conferentiebijdrage
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Aantal pagina's:
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Volledige tekst:
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4
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Download PDF
(1140kB)
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Gepresenteerd op: 16th European Photovoltaic Solar Energy Conference and Exhibition, Glasgow, Scotland, 1-5 mei 2000.
Samenvatting:
Two new techniques are described, one to locate shunts on solar cells(PRAMP) and one to map the specific contact resistance rc of the front side
metallisation (SCRAMP). In addition, the influence of a varying #rho#c on
the diode factor n and the series resistance of a cell was calculated. The
new techniques are both based on the mapping of a current induced potential
to analyse the resistance problems. The PRAMP scan proved to be an easy
technique to detect shunts with a resolution of
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