Scanning Electron Microscope

The Field Emission Gun-Scanning Electron Microscope (FEG-SEM) is a powerful instrument for the characterisation of surfaces. Both polished (prepared) surface and untreated surface can be examined. The latter e.g. concerning fracture surfaces, deposited coatings on fuel cells, etched surfaces on solar cells and many many more.

Because of the use of a Field Emission Gun, high signal to noise ratios can be obtained at low acceleration voltages, allowing examination of low conductive materials without applying conductive coatings that can interfere with chemical analyses.

The FEG-SEM is equipped with an energy dispersive X-ray analyses (EDX) system. This allows for a quick assessment of material compositions. Materials, phases and corrosion products can be identified. Elements starting from sodium (Na) can be analysed quantitatively thanks to the use of certified standards. Quantitative chemical analyses are possible on particles or phase down to a few microns in diameter. Thanks to automated analyses, this can be performed off-line. (Elements down to boron (B) can be detected provided they are present in sufficient quantity.)