Characterising wafers and solar cells

Wafers

• Wafer strength
• C_s, O_i (FTIR)
• Impurity levels
• Minority carrier lifetime & diffusion length (µW-PCD and QSSPC)
• Crystal density
• Resistivity

Cells

• I-V (dark, illuminated, reverse, forward, solar simulator)
• Spectral responsivity
• Spectral reflectance and transmission
• Series resistance free I-V
• Metalisation resistance (busbar-to-busbar)
• Defect and resistance imaging (PL, EL)
• Shunt imaging (Thermography)
• Contact resistance mapping (CORESCAN)
• Emitter sheet resistance mapping (SHERESCAN)
• Optical characterization thin-films (Ellipsometry)

Customers

• Manufacturers of feedstock and ingots
• Wafer suppliers
• Solar cell manufacturers